000 00495nam a2200193Ia 4500
008 221105s9999 xx 000 0 und d
020 _a0792379918
041 _aENGLISH
082 _a621.395 BUS
082 _bMIC
100 _aMICHAEL L BUSHNELL; VISHWANI D AGRAWAL
245 0 _aESSENTIALS OF ELECTRONIC TESTING FOR DIGITAL, MEMORY AND MIXED-SIGNAL VLSI CIRCUITS
250 _a-
260 _bSPRINGER.
260 _c2000
300 _a689 p.
650 _aVLSI DESIGN
942 _cBK
999 _c6168
_d6168