000
00248nam a22000977a 4500
245
_a
IEEE DESIGN AND TEST OF COMPUTERS
260
_a
NEW YORK
_c
IEEE COMPUTER SOCIETY
_b
2002
650
_a
DEEP SUBMICRON
942
_c
BV
952
_I
MAR 2002 : DEC 2002
999
_c
46604
_d
46604