000 00445nam a2200193Ia 4500
008 221105s9999 xx 000 0 und d
020 _a9788184894295
041 _aENGLISH
082 _a621.395 MAN
082 _bMAN
100 _aMANOJ SACHDEV
245 0 _aDWEFECT -ORIENTED TESTING FOR NANO -METRIC CMOS VLSI CIRCUITS
250 _a2
260 _bSPRINGER.
260 _c2010
300 _a328 p.
650 _aECE
942 _cBK
999 _c27772
_d27772