TY  - BOOK
AU  - LAUNG-TERNG WANG; CHENG-WEN WU; XIAOQING WEN EDS.
TI  - VLSI TEST PRINCIPLES AND ARCHITECTURES : DESIGN FOR TESTABILITY
SN  - 9789380501550
U1  - 621.395 WAN 
PB  - ELSEVIER.
KW  - VLSI DESIGN
ER  -