LAUNG-TERNG WANG; CHENG-WEN WU; XIAOQING WEN EDS. <br/><br/>
VLSI TEST PRINCIPLES AND ARCHITECTURES : DESIGN FOR TESTABILITY 

 - 
 -  ELSEVIER.  2011 
 - 777 p. 
<br/><br/><label>ISBN: </label>9789380501550 
<br/><br/><label>Subjects--Topical Terms: </label><br/>VLSI DESIGN
<br/><br/><label>Dewey Class. No.: </label>621.395 WAN  / LAU