MANOJ SACHDEV <br/><br/>
DWEFECT -ORIENTED TESTING FOR NANO -METRIC CMOS VLSI CIRCUITS 

 - 2 
 -  SPRINGER.  2010 
 - 328 p. 
<br/><br/><label>ISBN: </label>9788184894295 
<br/><br/><label>Subjects--Topical Terms: </label><br/>ECE
<br/><br/><label>Dewey Class. No.: </label>621.395 MAN  / MAN