FAULT-TOLERANCE AND RELIABILITY TECHNIQUES FOR HIGH-DENSITY RANDOM-ACCESS MEMORIES

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TextLanguage: English Publication details: PEARSON EDUCATION; 2002Description: 426ISBN:

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Item type	Current library	Call number	Materials specified	Status	Notes	Date due	Barcode
Book	Sri Krishna College of Engineering and Technology RACK 12 / SHELF 71	621.3973 (Browse shelf(Opens below))		Available	ECE		15987
Book	Sri Krishna College of Engineering and Technology RACK 12 / SHELF 93	621.3973 (Browse shelf(Opens below))		Available	ECE		15166

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Previous	621.38804 N6 COLOUR TELEVISION : PRINCIPLES AND PRACTICE	621.38887 N5 TELEVISION MAINTENANCE AND REPAIR	621.395 WES PRINCIPLES OF CMOS VLSI DESIGN : A SYSTEM PERSPECTIVE	621.3973 FAULT-TOLERANCE AND RELIABILITY TECHNIQUES FOR HIGH-DENSITY RANDOM-ACCESS MEMORIES	681.2 TELEMETRY PRINCIPLES

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