Item type | Current library | Call number | Materials specified | Status | Notes | Date due | Barcode |
---|---|---|---|---|---|---|---|
Book | Sri Krishna College of Engineering and Technology RACK 12 / SHELF 76 | 621.395 WOL (Browse shelf(Opens below)) | PAPER PACK | Available | ECE | 75777 |
Browsing Sri Krishna College of Engineering and Technology shelves, Shelving location: RACK 12 / SHELF 76 Close shelf browser (Hides shelf browser)
621.395 SZE VLSI TECHNOLOGY | 621.395 WAN VLSI TEST PRINCIPLES AND ARCHITECTURES : DESIGN FOR TESTABILITY | 621.395 WOL MODERN VLSI DESIGN : IP-BASED DESIGN | 621.395 WOL MODERN VLSI DESIGN : IP-BASED DESIGN | 621.395 WOL MODERN VLSI DESIGN : IP-BASED DESIGN | 621.395 WOL MODERN VLSI DESIGN : IP-BASED DESIGN | 621.395 YEO LOW-VOLTAGE, LOW-POWER VLSI SUBSYSTEMS |
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