Item type | Current library | Call number | Materials specified | Status | Notes | Date due | Barcode |
---|---|---|---|---|---|---|---|
Book | Sri Krishna College of Engineering and Technology RACK 12 / SHELF 86 | 621.395 WES (Browse shelf(Opens below)) | PAPER PACK | Available | ECE | 75468 | |
Book | Sri Krishna College of Engineering and Technology RACK 12 / SHELF 74 | 621.395 WES (Browse shelf(Opens below)) | PAPER PACK | Binding | ECE | 75172 | |
Book | Sri Krishna College of Engineering and Technology RACK 12 / SHELF 77 | 621.395 WES (Browse shelf(Opens below)) | PAPER PACK | Available | ECE | 75173 |
Browsing Sri Krishna College of Engineering and Technology shelves, Shelving location: RACK 12 / SHELF 86 Close shelf browser (Hides shelf browser)
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621.395 SZE VLSI TECHNOLOGY | 621.395 SZE VLSI TECHNOLOGY | 621.395 WAN VLSI TEST PRINCIPLES AND ARCHITECTURES DESIGN FOR TESTABILITY | 621.395 WES CMOS VLSI DESIGN : A CIRCUITS AND SYSTEMS PERSPECTIVE |
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