Item type | Current library | Call number | Materials specified | Status | Notes | Date due | Barcode |
---|---|---|---|---|---|---|---|
Book | Sri Krishna College of Engineering and Technology RACK 12 / SHELF 87 | 621.395 WOL (Browse shelf(Opens below)) | PAPER PACK | Available | ECE | 74535 | |
Book | Sri Krishna College of Engineering and Technology RACK 12 / SHELF 90 | 621.395 WOL (Browse shelf(Opens below)) | PAPER PACK | Checked out | ECE | 22/09/2024 | 74536 |
Browsing Sri Krishna College of Engineering and Technology shelves, Shelving location: RACK 12 / SHELF 87 Close shelf browser (Hides shelf browser)
621.395 WAN VLSI TEST PRINCIPLES AND ARCHITECTURES : DESIGN FOR TESTABILITY | 621.395 WES CMOS VLSI DESIGN: A CIRCUITS AND SYSTEMS PERSPECTIVE | 621.395 WES CMOS VLSI DESIGN: A CIRCUITS AND SYSTEMS PERSPECTIVE | 621.395 WOL MODERN VLSI DESIGN : IP-BASED DESIGN | 621.395 YEO LOW-VOLTAGE, LOW-POWER VLSI SUBSYSTEMS |
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