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INTEGRATED CIRCUIT TEST ENGINEERING : MODERN TECHNIQUES

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Material type: Text

TextLanguage: ENGLISH Publication details: SPRINGER.; 2009Description: 362 pISBN:

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Holdings
Item type	Current library	Call number	Materials specified	Status	Notes	Barcode
Book	Sri Krishna College of Engineering and Technology RACK 11 / SHELF 67	621.38153 GRO (Browse shelf(Opens below))	PAPER PACK	Available	ECE	72618
Book	Sri Krishna College of Engineering and Technology RACK 11 / SHELF 71	621.38153 GRO (Browse shelf(Opens below))	PAPER PACK	Available	ECE	72619
Book	Sri Krishna College of Engineering and Technology REF RACK 4 / SHELF 91	621.38153 GRO (Browse shelf(Opens below))	PAPER PACK	Available	ECE	72620
Book	Sri Krishna College of Engineering and Technology RACK 11 / SHELF 68	621.38153 GRO (Browse shelf(Opens below))	PAPER PACK	Available	ECE	62808

Previous				No cover image available	No cover image available			Next
Previous	621.381528 N7 TOWERS INTERNATIONAL TRANSISTOR SELECTOR	621.38153 BAK LINEAR INTEGRATED CIRCUITS AND APPLICATIONS	621.38153 FIO OPERATIONAL AMPLIFIERS AND LINEAR INTEGRATED CIRCUITS : THEORY AND APPLICATION	621.38153 GRO INTEGRATED CIRCUIT TEST ENGINEERING : MODERN TECHNIQUES	621.38153 KAP OPERATIONAL AMPLIFIERS AND LINEAR INTEGRATED CIRCUITS	621.38153 KIS OPERATIONAL AMPLIFIERS AND LINEAR INTEGRATED CIRCUITS	621.38153 NAI LINEAR INTEGRATED CIRCUITS : ANALYSIS, DESIGN AND APPLICATIONS	Next

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