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VLSI TEST PRINCIPLES AND ARCHITECTURES : DESIGN FOR TESTABILITY

LAUNG-TERNG WANG; CHENG-WEN WU; XIAOQING WEN EDS.

VLSI TEST PRINCIPLES AND ARCHITECTURES : DESIGN FOR TESTABILITY - - ELSEVIER. 2011 - 777 p.

ISBN: 9789380501550

Subjects--Topical Terms:
VLSI DESIGN

Dewey Class. No.: 621.395 WAN / LAU

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VLSI TEST PRINCIPLES AND ARCHITECTURES : DESIGN FOR TESTABILITY