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DWEFECT -ORIENTED TESTING FOR NANO -METRIC CMOS VLSI CIRCUITS

MANOJ SACHDEV

DWEFECT -ORIENTED TESTING FOR NANO -METRIC CMOS VLSI CIRCUITS - 2 - SPRINGER. 2010 - 328 p.

ISBN: 9788184894295

Subjects--Topical Terms:
ECE

Dewey Class. No.: 621.395 MAN / MAN

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DWEFECT -ORIENTED TESTING FOR NANO -METRIC CMOS VLSI CIRCUITS